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Development of high-power laser ablation process for polycrystalline diamond polishing Part 2: upscaling of PCD ultra-short pulsed laser ablation to high power

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conference contribution
posted on 2020-10-28, 09:00 authored by William Scalbert, David A. Tanner, Ronald Holtz
Properties of diamond are extreme. Since the first successful synthesis of diamond in 1955, the use of synthetic diamond has widely spread into diverse industries (e.g. manufacturing, electronics and optics). However, being the hardest material known, the manufacture of diamond material into an engineered tool is extremely challenging. The polishing process remains a traditional mechanical method existing for over hundreds of years. The development of alternative ways of polishing diamond is an active subject of research and has recently been investigated in topics such as chemically assisted mechanical polishing or ion beam polishing. Laser polishing is another alternative and a state-of-theart laser polishing method is presented in this paper. A high-power femtosecond laser ablation process is developed to achieve a high throughput polishing process of polycrystalline diamond composite (PCD) wafers. Laser ablation trials are carried out with a femtosecond laser delivering over 80W average power on three different PCD grades synthesized by high-pressure/higherature. The role of the fluence is highlighted and the effect of the burst mode on PCD is demonstrated for the first time to the best of our knowledge. Eventually, the roughness of the initial surface on fine grain diamond material is reduced by two while the ablation rate is twice higher than the removal rate achieved by mechanical polishing.

Funding

Study on Aerodynamic Characteristics Control of Slender Body Using Active Flow Control Technique

Japan Society for the Promotion of Science

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Ergativity in comprehension and production: language typology and processing

Swiss National Science Foundation

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History

Publication

Proc. SPIE 11273, High-Power Laser Materials Processing: Applications, Diagnostics, and Systems IX;1127303

Publisher

SPIE: The International Society for Optics and Photonics

Note

peer-reviewed

Other Funding information

ERC, European Union (EU)

Rights

Copyright 2020 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

Language

English

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