Flexible FPGA based digital IC test development education laboratory design and application

In this paper, a teaching aid for digital integrated circuit (IC) test development engineering education using the field programmable gate array (FPGA) is presented and discussed. The set-up allows for different digital IC test development scenarios to be configured within the FPGA. For analysis and evaluation purposes, embedded machine learning functions could also include automated reporting of the system use. A case study design, using a Xilinx Artix-7 FPGA, incorporating a circuit test set-up for an example digital IC based an implementation of the IEEE Std 1149.1 “IEEE Standard for Test Access Port and Boundary-Scan Architecture” is embedded within the FPGA. This is accessed by the user via a serial port connection. This case study design allows a user to investigate and implement test program development scenarios within a suitable education environment.