posted on 2023-03-03, 10:24authored byWilliam T. Lee, Andrew FowlerAndrew Fowler, O. Power, Sandra Healy, J. Browne
Polycrystalline silicon fuses are one time programmable memory elements which allow the calibration of integrated circuits at wafer and package level. We present a zero-dimensional lumped parameter model of the programming of fuses made from a combination of tungsten silicide and polycrystalline silicon. The components of the model are an electrical model, a thermal model, and a flow model. The model generates quantitatively accurate results and reproduces trends with applied voltage and fuse size. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3457469]
History
Publication
Applied Physics;97, 023502
Publisher
American Institute of Physics
Note
peer-reviewed
Other Funding information
SFI
Rights
Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article "Blowing of polycrystalline silicon fuses" appeared in Applied Physics Letters, 97, 023502 and may be found at http://dx.doi.org/10.1063/1.3457469
Language
English
Also affiliated with
MACSI - Mathematics Application Consortium for Science & Industry