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Testing method for measuring corrosion resistance of surface mount chip resistors

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journal contribution
posted on 2014-03-06, 09:55 authored by M. Reid, Maurice N. Collins, Eric D. Dalton, Jeff Punch, David A. Tanner
Surface mount chip resistors are amongst the simplest and most inexpensive of all components used in electronic circuits and systems. Typically, resistor failure modes include open circuits, resistive shorts or variations in resistance indicating parametric drift or intermittent failure, which in some applications result in overall system failure. Corrosion is currently believed to be the number one failure mechanism for chip resistors deployed in developing markets such as Central and Latin America, Asia, India and Pacific regions where aggressive corrosive conditions are prevalent. The objective of this study is to develop a test to identify or screen out corrosion-susceptible parts. Ten precision chip resistors types representative of resistors in contemporary printed circuit board assemblies are subjected to a well-defined multi-stress screen which comprises thermal cycling and mixed flowing gas exposure. The combination of thermal cycling and corrosive gas exposure is shown to provide an acceptable acceleration test to identify corrosion-susceptible parts by replicating field failures. Currently, no other test method exists which is capable of replicating field failures.

History

Publication

Microelectronics Reliability;52(7), pp. 1420-1427

Publisher

Elsevier

Note

peer-reviewed

Other Funding information

SFI

Rights

This is the author’s version of a work that was accepted for publication in Microelectronics Reliability. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Microelectronics Reliability, 52(7), pp. 1420-1427, http://dx.doi.org/10.1016/j.microrel.2012.02.020

Language

English

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