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Fabrication of magnetic force microscopy tips via electrodeposition and focused ion beam milling

Date
2008
Abstract
A method is described for the fabrication of magnetic force microscopy tips via localized electrodeposition and focused ion beam milling departing from commercial tapping mode tips. Very high aspect ratios and interacting magnetic moments are possible without altering significantly the tapping resonant frequency of the cantilever. These tips can achieve high magnetic resolution at room temperature and open atmosphere. They can also be fabricated into any shape, with applications for ferromagnetic resonance measurements and nano-imprinting.
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Description
peer-reviewed
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Citation
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Physics
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Rhen_fabrication.pdf
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Keywords
electrodeposition, focused ion beam milling, magnetic force microscopy (MFM), tip fabrication
ULRR Identifiers
https://researchrepository.ul.ie/handle/10344/517
 https://doi.org/10.34961/10091
Funding code
Funding Information
Science Foundation Ireland (SFI)
Sustainable Development Goals
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Type
Article
Rights
https://creativecommons.org/licenses/by-nc-sa/1.0/
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