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Development of a novel humidity sensor with error-compensated measurement system

Date
2002
Abstract
This paper documents the creation of a complete PC-Based humidity sensing system, implemented using LabVIEW from National Instruments. The humidity sensor, which has a measured sensitivity of 0.25%/RH%, is manufactured by thin film technology from a novel combination of SiO/In2O3. Both the humidity sensor and a standard temperature sensor are interfaced to a PC using a front-end signal conditioning circuit. The entire system has been analyzed mathematically and the necessary algorithms for error-compensation have been developed. The resulting measurement system is efficient, accurate and flexible.
Supervisor
Description
peer-reviewed
Publisher
IEEE Computer Society
Citation
Microelectronics, 2002. MIEL 2002. 23rd International Conference;1, pp. 215-218
Collections
Electronic & Computer Engineering
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Arshak%20Development%20of%20a%20novel%20humidity.pdf
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Keywords
computerised instrumentation, error compensation, humidity sensors, indium compounds, semiconductor materials
ULRR Identifiers
https://researchrepository.ul.ie/handle/10344/2551
 https://doi.org/10.34961/3495
Funding code
Funding Information
Sustainable Development Goals
External Link
Type
Meetings and Proceedings
Rights
https://creativecommons.org/licenses/by-nc-sa/1.0/
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