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Random depth access full-field heterodyne low-coherence interferometry utilizing acousto-optic modulation and a complementary metal-oxide semiconductor camera

Date
2006
Abstract
With analog scanning, time-domain low-coherence interferometry lacks precise depth information, and optical carrier generation demands a linear scanning speed. Full-field heterodyne low-coherence interferometry that uses a logarithmic complementary metal-oxide semiconductor camera, acousto-optic modulation, and digital depth stepping is reported, with which random regions of interest, lateral and axial, can be accessed. Furthermore, nanometer profilometry is possible through heterodyne phase retrieval of the interference signal. The approach demonstrates inexpensive yet high-precision functional machine vision offering true digital random access in three dimensions.
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Description
peer-reviewed
Publisher
Optical Society of America
Citation
Optics Letters;31/ 7/ pp.912-914
Collections
Electronic & Computer Engineering
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Connelly_random.pdf
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Keywords
interferometry, heterodyne
ULRR Identifiers
https://researchrepository.ul.ie/handle/10344/1176
 https://doi.org/10.34961/4066
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Funding Information
Sustainable Development Goals
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Type
Article
Rights
https://creativecommons.org/licenses/by-nc-sa/1.0/
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