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Full-field phase measurement by wavelength-tuning interferometry in the C-band

Date
2006
Abstract
Fluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm.
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Description
peer-reviewed
Publisher
Society of Photo-Optical Instrumentation Engineers (SPIE)
Citation
Optical Engineering;45/12/ pp. 120504-1 - 120504-3
Collections
Electronic & Computer Engineering
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Connelly_full_filed_phase.pdf
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Keywords
interferometry, phase retrieval, phase measurement
ULRR Identifiers
https://researchrepository.ul.ie/handle/10344/1145
 https://doi.org/10.34961/3499
Funding code
Funding Information
Sustainable Development Goals
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Type
Article
Rights
https://creativecommons.org/licenses/by-nc-sa/1.0/
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