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Publication

Flexible FPGA based digital IC test development education laboratory design and application

Date
2020
Abstract
In this paper, a teaching aid for digital integrated circuit (IC) test development engineering education using the field programmable gate array (FPGA) is presented and discussed. The set-up allows for different digital IC test development scenarios to be configured within the FPGA. For analysis and evaluation purposes, embedded machine learning functions could also include automated reporting of the system use. A case study design, using a Xilinx Artix-7 FPGA, incorporating a circuit test set-up for an example digital IC based an implementation of the IEEE Std 1149.1 “IEEE Standard for Test Access Port and Boundary-Scan Architecture” is embedded within the FPGA. This is accessed by the user via a serial port connection. This case study design allows a user to investigate and implement test program development scenarios within a suitable education environment.
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Description
peer-reviewed
Publisher
IEEE Computer Society
Citation
17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON);pp.341-344
Collections
Electronic & Computer Engineering
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Grout_2020_Flexible.pdf
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Keywords
test engineering, machine learning, JTAG, VHDL, FPGA
ULRR Identifiers
https://researchrepository.ul.ie/handle/10344/9307
 https://doi.org/10.34961/3541
Funding code
Funding Information
Sustainable Development Goals
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Type
Meetings and Proceedings
Rights
https://creativecommons.org/licenses/by-nc-sa/1.0/
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