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Arshak Gamma Radiation Dos using screen.pdf (240.56 kB)

γ-Radiation dosimetry using screen printed nickel oxide thick films

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conference contribution
posted on 2011-07-01, 15:36 authored by Khalil Arshak, Olga Korostynska, John A. Harris
Thick films of Nickel oxide (NiO) were investigated for γ-radiation dosimetry purposes. Samples were fabricated using the thick film screen printing technique. Absorption spectra for NiO films were recorded and the values of the optical band gap for as-printed, irradiated and annealed films were calculated. It was found that the optical band gap value decreased as the radiation dose was increased. Samples with an Ag-NiO-Ag sandwich structure were exposed to a 60Co γ-radiation source at a dose rate of 6 Gy/min. The relative change in current increased linearly with increased dosage up to 720 Gy. The I-V characteristics indicated a Poole-Frenkel conduction mechanism. It was found that annealing restored both the electrical and the optical properties of the samples.

History

Publication

MIEL 2002, 23rd International Conference on Microelectronics, 2002;

Publisher

IEEE Computer Society

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peer-reviewed

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©2002 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.

Language

English

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