Enhanced imaging from multiply scattered waves

Many imaging methods involve probing a material with a wave and observing the back-scattered wave. The back-scattered wave measurements are used to compute an image of the internal structure of the material. Many of the conventional methods make the assumption that the wave has scattered just once from the region to be imaged before returning to the sensor to be recorded. The purpose of this paper is to show how this restriction can be partially removed and also how its removal leads to an enhanced image, free of the artifacts often associated with the conventionally reconstructed image.