posted on 2011-07-21, 09:17authored byPatrick Egan, Fereydoun Lakestani, Maurice P. Whelan, Michael J. Connelly
Fluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval
utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm.
History
Publication
Optical Engineering;45/12/ pp. 120504-1 - 120504-3
Publisher
Society of Photo-Optical Instrumentation Engineers