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Self-pixelation through fracture in VO2 thin films

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journal contribution
posted on 2020-05-11, 14:21 authored by Laura Rodríguez, Elena del Corro, Michele A. Conroy, Kalani Moore, Felip Sandiumenge, Neus Domingo, Jose Santiso, Gustau Catalan
Vanadium dioxide (VO2) is an archetypal Mott material with a metal-insulator transition (MIT) near room temperature. In thin films, this transition is affected by substrate-induced strain but, as film thickness increases, the strain is gradually relaxed and the bulk properties are recovered. Epitaxial films of VO2 on (001)-oriented rutile titanium dioxide (TiO2) relax substrate strain by forming a network of fracture lines that crisscross the film along well-defined crystallographic directions. This work shows that the electronic properties associated with these lines result in a pattern that resembles a “street map” of fully strained metallic VO2 blocks separated by insulating VO2 stripes. Each block of VO2 is thus electronically self-insulated from its neighbors and its MIT can be locally induced optically with a laser, or electronically via the tip of a scanning probe microscope, so that the films behave functionally as self-patterned pixel arrays.

History

Publication

ACS Applied Electronic Materials; 2 (5), pp.1433-1439

Publisher

ACS Applied Electronic Materials

Note

peer-reviewed

Other Funding information

SFI, Spanish Ministry of Economy and Competitiveness

Rights

©2020 ACS This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Applied Electronic Materials, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://doi.org/10.1021/acsaelm.0c00199

Language

English

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